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Nestor J. Zaluzec Electron Microscopy Center Materials Science/Bldg 212 Argonne, Illinois 60439 USA Tel: 530-637-8679 (530-NES-TORZ) Fax: 630-252-4798 Email: Zaluzec@aaem.amc.anl.gov iChat:Zaluzec@AIM Skype: Zaluzec-at-ANL TPM: http://tpm.amc.anl.gov WWW: http://www.amc.anl.gov |
A senior scientist and principle investigator in the Electron Microscopy Center at Argonne National Laboratory as well as a Fellow of both Oak Ridge National Laboratory, and the Computational Institute of the University of Chicago, Nestor's research includes the development of state-of-the-art instrumentation and techniques for atomic resolution x-ray and electron spectroscopy, analytical, and scanning confocal electron microscopy.
In addition to creating tools for science, he also uses these leading-edge technologies to study issues in technologically important materials. His work over the last 30 years has included studies in the areas of structural phase transformation in metals, radiation damage in alloys, ceramic oxides for geologic immobilization of nuclear waste materials, elemental segregation in semiconductors devices, magnetism, genetically engineered proteins for bio-materials nanoarrays and most recently studies of catalysis using analytical microscopy. He was one of the earliest to realize the potential impact of the Internet on science and established the first TelePresence Microscopy Collaboratory, which is serves as a model for outreach to both the scientific and education communities, providing unencumbered access to scientific resources.
Nestor has received numerous awards for his research and educational outreach. They include: Fellow of the Microscopy Society of America, Distinguished Alumni Award from the College of Engineering at the University of Illinois, Kohler Award by the State Microscopical Society of Illinois, Distinguished Service Award Australian Microscopy and Microanalysis Society, two R&D 100 Awards one for the invention of the Scanning Confocal Electron Microscope and the second for the π sR X-ray Detector, the Maser Distinguished Service Award from MSA, Presidential International Collaboration Award from the Australian Microscopy Society, Honorary Lifetime Member of the Illinois Junior Academy of Science, Science Digest 100 Brightest Scientists Award, and the E.F. Burton Award for Contributions to Microscopy by a Young Scientist from MSA. He has and continues to hold numerous positions on local, national and international committees and engages the next generation of scientists through his adjunct work over the years with local universities (NIU , UofC, UIUC, UIC, IIT) as well as with middle and high school students through the Illinois Junior Academy of Science.
Nestor received his B.S. degree in Physics at Illinois Institute of Technology in Chicago, and his PhD in 1978 from the Department of Metallurgy at the University of Illinois Urbana-Champaign.
March, 2011
Present Research Position
Senior Scientist: Electron Microscopy Center, Materials Science Div, Argonne National Laboratory
Senior Fellow: Computational Institute University of Chicago
E.P. Wigner Fellow: Oak Ridge National Laboratory
Adjunct Professor of Physics: Northern Illinois University
Current Research Interest Areas
Microcharacterization of Materials via Electron Microscopy/Microanalysis
Computationally Mediated Experimental Science
Tele Presence Collaboration and Distance Learning
Education
PhD. Department of Metallurgy University of Illinois- Urbana Champaign, Illinois 1978
BS. Department of Physics Illinois Institute of Technology, Chicago, Illinois, 1973
University Appointments
1980-1984: Adjunct Assistant Professor Dept. of Metallurgy Illinois Institute of Technology-Chicago
1980-1982: Adjunct Assistant Professor Dept. of Metallurgy, University of Illinois-Urbana
1982-1984: Adjunct Associate Professor Dept. of Metallurgy, University of Illinois-Urbana
1985-1997: Adjunct Professor Dept. of Mat. Science and Engineering, University of Illinois-Urbana
1995-2001: Visiting Scientist Dept. of Materials Science Cambridge University- UK.
1997-2005: Adjunct Professor of Physics, University of Illinois at Chicago
1999-2010: Visiting Professor of Physics, Northern Illinois University
2004-present: Senior Fellow Computational Institute of the University of Chicago
2010-present: Adjunct Professor of Physics, Northern Illinois University
Professional Activities
1978-present: Eugene P. Wigner Fellow - Oak Ridge National Laboratory
1980-1983: Assistant Scientist Materials Science Division Argonne National Laboratory
1983-2005: Scientist Materials Science Division Argonne National Laboratory
1984-1994: Scientific Director and Group Leader, Electron Microscopy Center, Argonne Nat. Lab.
1985-present: Illinois Junior Academy of Science Region 11 Organization Committee
1986-present: Coordinator MSA Computer Workshop & Software Library
1987-1994: MSA Bulletin Editor
1987-1992: Editor Journal of Electron Microscopy Technique
1988-present: Program Committee Microscopy Society of America
1989-present: Education Committee Microscopy Society of America
1990-present: Chair: Standards Committee Microscopy Society of America
1990-2000: University of Illinois MatSEA Alumni Board of Directors
1990-present: Illinois Junior Academy of Science-Board of Directors
1990-1994: Director Materials Science Program: Midwest Society of EM
1992-1997: ASTM E-42 Standards Committee
1992-1997: Chair: ISO Standards Committee TC-202 on Analytical Electron Microscopy
1992-2006: Chair: ISO Standards Working Group WG-202 on Data Management and Treatment
1993-1996: MicroBeam Analysis Society Journal Editor
1994-1996: President Midwest Microscopy and Microanalysis Society
1995: Program Chair Microscopy & Microanalysis Meeting – Kansas City, Mo
1995: Editor Proceedings of Microscopy & Microanalysis 1995
1996: Editor Proceedings of Microscopy & Microanalysis 1996
1996: Program Chair Microscopy & Microanalysis Meeting – Minneapolis, Mn
1997-present: Editorial Board Journal of Microscopy and Microanalysis
1998-present: Editorial Board Microscopy & Analysis
1998-2006: Energy Science Network Steering Committee - DoE/BES Representative
2001-present: ANL MCS Computer Sciences Advisory Committee
2002-2005 : Director Materials Science Section: Microscopy Society of America
2003-2006: LAC Chair–Microscopy & Microanalysis Meeting Chicago-2006
2005-present: Senior Scientist Materials Science Division Argonne National Laboratory
2010-2011: President Microscopy Society of America
Professional Honors & Awards
1978: Eugene P. Wigner Research Fellow - Oak Ridge National Lab
1982: Microscopy Soc. of America: E.F. Burton Award for contributions to electron microscopy
1984: Science Digest: One of America's 100 Brightest Scientists
1987: Distinguished Service Award EMSA Bulletin.
1993: Member of the Year: Midwest Society of Electron Microscopists
1995: Honorary Lifetime Member Illinois Junior Academy of Science
1996: Presidential Citation: Australian Society for Electron Microscopy
1997: University of Illinois Alumni Association: Award for Service to the University
1998: Microscopy Society of America: Distinguished Service Award
2002: Elected as Microscopy Society of America Council Member
2003: Microscopy Society of America: Best Instrumentation Poster: SCEM
2003: R&D 100 Award: Scanning Confocal Electron Microscope
2004: Australian Microscopy Society: Distinguished Service Award
2004: Microscopy Society of America: Traveling Poster Award – Insitu Lorentz Stage for the TEM
2004: August K¿hler Award: State Microscopical Society of Illinois
2005: University of Illinois, College of Engineering - Distinguished University Alumni
2009: Fellow of the Microscopy Society of America
2010: R&D 100 Award: The ¹ Steradian X-ray Detector for Electron-Optical Beam Lines.
Professional Society Memberships
Microscopy Society of America (MSA): 1979-present
Microbeam Analysis Society (MAS): 1979-present
Australian Society for Electron Microscopy: 1988-present
Midwest Microscopy and Microanalysis Society: 1990-present
Microscopical Society of Canada: 1993-present
Royal Microscopical Society (U.K): 1992-1996
American Society for Testing of Materials: 1992-1997
International Standards Organization: 1992-present
European Microscopy Society: 1997-present
Patents
1996: US Patent # 5,510624: Simultaneous Specimen and Stage Cleaning Device for an AEM
2003: US Patent #6548810: The Scanning Confocal Electron Microscope
2010: US Patent (Pending) #13/041,265: High Collection Efficiency X-Ray Spectrometer System With Integrated Electron Beam Stop , Electron Detector And X-Ray Detector For Use On Electron-Optical Beam Lines And Microscopes
Refereed Journal Articles - 78
Refereed Book Chapters - 5
Refereed Proceedings & Publications - 148
Non-Refereed Conference Proceedings – 41
Technical Reports & Other Publications - 7
Invited Presentations, Lectures & Seminars at Conferences & Symposia - 206
Invited Presentations, Lectures & Seminars (non-Conference) – 46
Contributed Presentations, Lectures & Seminars at Conferences & Symposia - 83
Selected Recent Publications
Substantial crystalline topology in amorphous silicon
J. M. Gibson, M. M. J. Treacy, T. Sun, N.J. Zaluzec
Physical Review Letters in press (Sept 2010).
Extracting physically interpretable data from electron energy-loss spectra
C. Witte , N.J. Zaluzec , L.J. Allen
Ultramicroscopy 110 (2010) 1390–1396 doi:10.1016/j.ultramic.2010.07.003
III-nitride nanopyramid leds grown by organometallic vapor phase epitaxy
I. H. Wildeson, R. Colby, F. A. Ewoldt, Z. Liang, D.N. Zakharov, N. J. Zaluzec, R. E. Garcia, E. A. Stach and T. D. Sands1
JOURNAL OF APPLIED PHYSICS 108, 1 2010 doi: 10.1063/1.3466998
Radiation tolerance of Mn+1axn phases, Ti3AlC2 and Ti3SiC2
K.R. Whittle, M.G. Blackford, R.D. Aughterson, S. Moricca, G.R. Lumpkin, D.P. Riley, N.J. Zaluzec
Acta Mater (2010), doi:10.1016/j.actamat.2010.04.029
Single Atom Detection by XEDS in the Aberration Corrected AEM: Is it Feasible?
Nestor J. Zaluzec , Microsc Microanal 15(Suppl 2), 2009 458-459, doi: 10.1017/S1431927609095646
Innovative Instrumentation for Analysis of Nanoparticles: The ¹ Steradian Detector
Nestor J. Zaluzec , Microscopy Today, Volume 17, Issue 4 Aug 2009, pp 56 - 59 10.1017S1551929509000224
Ion Irradiation of Ternary Pyrochlore Oxides
Gregory R. Lumpkin,* Katherine L. Smith, Mark G. Blackford, and Karl R. Whittle, Elizabeth J. Harvey and Simon A. T. Redfern, Nestor J. Zaluzec, Chem. Mater. (2009), 21, 2746–2754, DOI:10.1021/cm9003917
Detector Solid Angle Calculations for X-ray Energy Dispersive Spectrometry
Nestor J. Zaluzec , Microscopy & Microanalysis , 15, 93-98, (2009) doi:10.1017/S1431927609090217
Nanometer-scale sharpness in corner-overgrown heterostructures L. Steinke, P. Cantwell, D. Zakharov, E. Stach, N. J. Zaluzec, A. Fontcuberta i Morral, M. Bichler, G. Abstreiter, M. Grayson
Applied Physics Letters 93, #19 10.1063/1.2988526 (2008)
Single Particle Plasmon Spectroscopy of Silver Nanowires and Gold Nanorods
Moussa NÕGom, Jan Ringnalda, John F. Mansfield, Ashish Agarwal , Nicholas Kotov, and Nestor J. Zaluzec, Theodore B. Norris , Nano Letters 8, #10 3200-3204 (2008) 10.1021/nl801504v
In situ radiation damage studies of LaSrTiO Perovskites
K.L. Smith, G.R. Lumpkin, M.G. Blackford, M. Colella, and N.J. Zaluzec
Journal Of Applied Physics 103, 083531 2008
High Angular Resolution Electron Energy Loss Spectroscopy of Hexagonal Boron-Nitride.
R. Arenal, M. Kociak, N.J. Zaluzec , Appl. Phys. Lett. 90, 204105 (2007)
Modelling High-Resolution Electron Microscopy Based On Core- Los Spectroscopy
Ultramicroscopy. 106, 1001-1011 (2006)
L.J.Allen, S.D.Findlay, M.P.Oxley, C.Witte, N.J.Zaluzec