Nestor J. Zaluzec

Argonne National Laboratory
Electron Microscopy Center
Bldg 212/A-143
Argonne, Illinois 60439 USA
Tel: 530-637-8679 (530-NES-TORZ)
Fax: 630-252-4798
Email: Zaluzec@aaem.amc.anl.gov

iChat:Zaluzec@AIM
Skype: Zaluzec-at-ANL
TPM: http://tpm.amc.anl.gov
WWW: http://www.amc.anl.gov

A senior scientist and principle investigator in the Electron Microscopy Center at Argonne National Laboratory as well as a Fellow of both Oak Ridge National Laboratory, and the Computational Institute of the University of Chicago, Nestor's research includes the development of state-of-the-art instrumentation, software and techniques for x-ray and electron spectroscopy, analytical, and scanning confocal electron microscopy.

In addition to creating tools for science, he also uses these leading-edge technologies to study issues in technologically important materials. His work over the last 30 years has included studies in the areas of structural phase transformation in metals, radiation damage in alloys, ceramic oxides for geologic immobilization of nuclear waste materials, elemental segregation in a wide range of materials ranging from metals and catalytst to semiconductors and superconductors, magnetic dichroism, genetically engineered bio-materials and most recently studies of optical photovoltaics and plasmonics in coupled and hybrid nanostructures. He currently is investigating how aberration corrected instruments can be reengineered to improve the sensitivity of spectroscopy in analytical modes. He was one of the earliest to realize the potential impact of the Internet on science and established the first TelePresence Microscopy Collaboratory, which has served as a model for outreach to both the scientific and education communities, providing unencumbered access to scientific resources.

Nestor has received numerous awards for his research and educational outreach. They include: Fellow of the Microscopy Society of America, Distinguished Alumni Award from the College of Engineering at the University of Illinois, the August Kohler Award from the State Microscopical Society of Illinois, Distinguished Service Award Australian Microscopy and Microanalysis Society, the Maser Distinguished Service Award from MSA, the AMMS Presidential International Collaboration Award, Honorary Lifetime Member of the Illinois Junior Academy of Science, Science Digest 100 Brightest Scientists Award, and the E.F. Burton Award for Contributions to Microscopy by a Young Scientist. Nestor also founded and was the first Director of the Electron Microscopy Center at Argonne National Laboratory, where he developed the first parallel EELS system to employ CCD array detectors, plasma cleaning technology for EM, and has received two R&D 100 Awards one for the invention of the Scanning Confocal Electron Microscope and the second for the ¹ sR X-ray Detector. He has and continues to hold numerous positions on local, national and international committees and engages the next generation of scientists through his adjunct work over the years with local universities (NIU , UofC, UIUC, UIC, IIT) as well as with middle and high school students through the Illinois Junior Academy of Science.

Nestor received his B.S. degree in Physics at Illinois Institute of Technology in Chicago, and his PhD in 1978 from the Department of Metallurgy at the University of Illinois Urbana-Champaign.

September 2012



Education

 

BS.   Department of Physics          Illinois Institute of Technology, Chicago, Illinois, 1973

PhD. Department of Metallurgy    University of Illinois- Urbana Champaign, Illinois 1978

 

Professional Experience

 

1978-present: Eugene P. Wigner Fellow - Oak Ridge National Laboratory

1980-1983: Assistant Scientist Materials Science Division Argonne National Laboratory

1983-2005: Scientist Materials Science Division Argonne National Laboratory

1984-1994: Scientific Director and Group Leader, Electron Microscopy Center, Argonne Nat. Lab.

2004-present: Senior Fellow Computation Institute University of Chicago

2005-present: Senior Scientist, Electron Microscopy Center, Argonne National Laboratory

 

Professional Activities

 

1985-present: Illinois Junior Academy of Science Region 11 Organization Committee

1986-present: Coordinator MSA Computer Workshop & Software Library

1987-1994: MSA Bulletin Editor

1987-1992: Editor Journal of Electron Microscopy Technique

1988-present: Program Committee Microscopy Society of America

1989-present:  Education Committee Microscopy Society of America

1990-present: Chair: Standards Committee Microscopy Society of America

1990-2000: University of Illinois MatSEA Alumni Board of Directors

1990-present: Illinois Junior Academy of Science-Board of Directors

1990-1994: Director Materials Science Program: Midwest Society of EM

1992-1997: ASTM E-42 Standards Committee

1992-1997: Chair: ISO Standards Committee TC-202 on Analytical Electron Microscopy

1992-2006: Chair: ISO Standards Working Group WG-202 on Data Management and Treatment

1993-1996: MicroBeam Analysis Society Journal Editor

1994-1996: President Midwest Microscopy and Microanalysis Society

1995: Program Chair Microscopy & Microanalysis Meeting – Kansas City, Mo

1995: Editor Proceedings of Microscopy & Microanalysis 1995

1996: Editor Proceedings of Microscopy & Microanalysis 1996

1996: Program Chair Microscopy & Microanalysis Meeting – Minneapolis, Mn

1997-present: Editorial Board Journal of Microscopy and Microanalysis

1998-present: Editorial Board Microscopy & Analysis

1998-2006: Energy Science Network Steering Committee - DoE/BES Representative

2001-2010: ANL MCS Computer Sciences Advisory Committee

2002-2005  : Director Materials Science Section: Microscopy Society of America

2003-2006: LAC Chair–Microscopy & Microanalysis Meeting Chicago-2006

2010-present:  President–Elect, President, Past-President Microscopy Society of America

 

Professional  Honors & Awards

 

 

1978: Eugene P. Wigner Research Fellow - Oak Ridge National Lab

1982: Microscopy Soc. of America: E.F. Burton Award for contributions to electron microscopy 

1984: Science Digest: One of America's 100 Brightest Scientists

1987: Distinguished Service Award EMSA Bulletin.

1993: Member of the Year: Midwest Society of Electron Microscopists

1995: Honorary Lifetime Member Illinois Junior Academy of Science

1996: Presidential Citation: Australian Society for Electron Microscopy

1997: University of Illinois Alumni Association: Award for Service to the University

1998: Microscopy Society of America:  Distinguished Service Award

2002: Elected as Microscopy Society of America Council Member

2003: Microscopy Society of America: Best Instrumentation Poster: SCEM

2003: R&D 100 Award: Scanning Confocal Electron Microscope

2004: Australian Microscopy Society: Distinguished Service Award

2004: Microscopy Society of America: Traveling Poster Award – Insitu Lorentz Stage for the TEM

2004: August K¿hler Award: State Microscopical Society of Illinois

2005: University of Illinois, College of Engineering - Distinguished University Alumni

2009: Fellow of the Microscopy Society of America

2010: R&D 100 Award: The ¹ Steradian X-ray Detector for Electron-Optical Beam Lines.

2012: Presidential Science Award: Microanalysis Society of America

 

Professional Society Memberships

 

 

Microscopy Society of America (MSA): 1979-present

Microbeam Analysis Society (MAS): 1979-present

Australian Society for Electron Microscopy: 1988-present

Midwest Microscopy and Microanalysis Society: 1990-present

Microscopical Society of Canada: 1993-present

Royal Microscopical Society (U.K): 1992-1996

American Society for Testing of Materials: 1992-1997

International Standards Organization: 1992-present

European Microscopy Society: 1997-present

 

University Appointments

 

 

1980-1984: Adjunct Assistant Professor Dept. of Metallurgy Illinois Institute of Technology-Chicago

1980-1982: Adjunct Assistant Professor Dept. of Metallurgy, University of Illinois-Urbana

1982-1984: Adjunct Associate Professor Dept. of Metallurgy, University of Illinois-Urbana

1985-1997: Adjunct Professor Dept. of Mat. Science and Engineering, University of Illinois-Urbana

1995-2001: Visiting Scientist Dept. of Materials Science Cambridge University- UK.

1997-2010: Adjunct Professor of Physics, University of Illinois at Chicago

1999-2010: Visiting Professor of Physics, Northern Illinois University

2004-present: Senior Fellow Computational Institute of the University of Chicago

2010-present: Adjunct Professor of Physics, Northern Illinois University

 

Publications, Presentations, Patents, Software Copyrights

 

Refereed Publications : Journals, Proceedings, Books - 235

Invited Presentations :  Lectures, Seminars, Conference, Workshops - 272

Contributed Presentations,  Technical Reports & Others - 138

              Patents – 3

            Copyrighted  Software -1

 

Current Research Interest Areas

Microcharacterization of Materials via Electron Microscopy/Microanalysis

Computationally Mediated Experimental Science

Tele Presence Collaboration and Distance Learning


Selected Recent Publications                                                                                            

 

Multimetallic Au/FePt3 Nanoparticles as Highly Durable Electrocatalyst

C. Wang, Dennis van der Vliet, Karren L. More, Nestor J. Zaluzec, Sheng Peng, Shouheng Sun,

Hideo Daimon, Guofeng Wang, Jeffrey Greeley, John Pearson, Arvydas P. Paulikas, Goran Karapetrov, Dusan Strmcnik, Nenad M. Markovic, and Vojislav R. Stamenkovic

Nano Lett. 2011, 11, 919926 dx.doi.org/10.1021/nl102369k

 

Ion irradiation of novel yttrium/ytterbium-based pyrochlores: The effect of disorder

Karl R. Whittle , Mark G. Blackford, Robert D. Aughterson, Gregory R. Lumpkin,

Nestor J. Zaluzec  Acta Materialia 59 (2011) 7530–7537  doi:10.1016/j.actamat.2011.09.021

 

On the Performance of XEDS and EELS in the AEM: 25 Years Later

H.L. Fraser, D.O. Klenov, Y.C. Wang, H. Cheng  N. J. Zaluzec
MicroscMicroanal. 17 (Suppl 2), 2011 doi:10.1017/S1431927611005174   590-591

 

Substantial crystalline topology in amorphous silicon

J. M. Gibson, M. M. J. Treacy, T. Sun, N.J. Zaluzec

Physical Review Letters –PRL 105, 125504 (2010) DOI: 10.1103/PhysRevLett.105.125504

 

Extracting physically interpretable data from electron energy-loss spectra

C. Witte , N.J. Zaluzec , L.J. Allen

Ultramicroscopy 110 (2010) 1390–1396 doi:10.1016/j.ultramic.2010.07.003

 

III-nitride nanopyramid leds grown by organometallic vapor phase epitaxy

I. H. Wildeson, R. Colby, F. A. Ewoldt, Z. Liang, D.N. Zakharov, N. J. Zaluzec, R. E. Garcia, E. A. Stach and T. D. Sands1JOURNAL OF APPLIED PHYSICS 108, 1 􏰁2010 doi: 10.1063/1.3466998

 

Radiation tolerance of Mn+1axn phases, Ti3AlC2 and Ti3SiC2

K.R. Whittle, M.G. Blackford, R.D. Aughterson, S. Moricca, G.R. Lumpkin, D.P. Riley, N.J. Zaluzec

Acta Mater (2010), doi:10.1016/j.actamat.2010.04.029

 

Single Atom Detection by XEDS in the Aberration Corrected AEM: Is it Feasible?

Nestor J. Zaluzec , Microsc Microanal 15(Suppl 2), 2009 458-459, doi: 10.1017/S1431927609095646

 

Innovative Instrumentation for Analysis of Nanoparticles: The ¹ Steradian Detector

Nestor J. Zaluzec , Microscopy Today,  Volume 17,   Issue 4   Aug 2009,   pp 56 – 59 10.1017S1551929509000224

 

Ion Irradiation of Ternary Pyrochlore Oxides

Gregory R. Lumpkin,* Katherine L. Smith, Mark G. Blackford, and Karl R. Whittle, Elizabeth J. Harvey and Simon A. T. Redfern, Nestor J. Zaluzec, Chem. Mater. (2009), 21, 2746–2754, DOI:10.1021/cm9003917

 

Detector Solid Angle Calculations  for  X-ray Energy Dispersive Spectrometry

Nestor J. Zaluzec , Microscopy & Microanalysis , 15, 93-98,  (2009) doi:10.1017/S1431927609090217

 

Nanometer-scale sharpness in corner-overgrown heterostructures L. Steinke, P. Cantwell, D. Zakharov, E. Stach, N. J. Zaluzec, A. Fontcuberta i Morral, M. Bichler, G. Abstreiter, M. Grayson 

Applied Physics Letters  93, #19 10.1063/1.2988526 (2008)

 

Single Particle Plasmon Spectroscopy of Silver Nanowires and Gold Nanorods     

Moussa NÕGom, Jan Ringnalda, John F. Mansfield, Ashish Agarwal , Nicholas Kotov, and Nestor J. Zaluzec, Theodore B. Norris , Nano Letters 8, #10 3200-3204 (2008)  10.1021/nl801504v