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Nestor J. Zaluzec Electron Microscopy Center Bldg 212/A-143 Argonne, Illinois 60439 USA Tel: 530-637-8679 (530-NES-TORZ) Fax: 630-252-4798 Email: Zaluzec@aaem.amc.anl.gov iChat:Zaluzec@AIM Skype: Zaluzec-at-ANL TPM: http://tpm.amc.anl.gov WWW: http://www.amc.anl.gov |
A senior scientist and principle investigator in the Electron Microscopy Center at Argonne National Laboratory as well as a Fellow of both Oak Ridge National Laboratory, and the Computational Institute of the University of Chicago, Nestor's research includes the development of state-of-the-art instrumentation, software and techniques for x-ray and electron spectroscopy, analytical, and scanning confocal electron microscopy.
In addition to creating tools for science, he also uses these leading-edge technologies to study issues in technologically important materials. His work over the last 30 years has included studies in the areas of structural phase transformation in metals, radiation damage in alloys, ceramic oxides for geologic immobilization of nuclear waste materials, elemental segregation in a wide range of materials ranging from metals and catalytst to semiconductors and superconductors, magnetic dichroism, genetically engineered bio-materials and most recently studies of optical photovoltaics and plasmonics in coupled and hybrid nanostructures. He currently is investigating how aberration corrected instruments can be reengineered to improve the sensitivity of spectroscopy in analytical modes. He was one of the earliest to realize the potential impact of the Internet on science and established the first TelePresence Microscopy Collaboratory, which has served as a model for outreach to both the scientific and education communities, providing unencumbered access to scientific resources.
Nestor has received numerous awards for his research and educational outreach. They include: Fellow of the Microscopy Society of America, Distinguished Alumni Award from the College of Engineering at the University of Illinois, the August Kohler Award from the State Microscopical Society of Illinois, Distinguished Service Award Australian Microscopy and Microanalysis Society, the Maser Distinguished Service Award from MSA, the AMMS Presidential International Collaboration Award, Honorary Lifetime Member of the Illinois Junior Academy of Science, Science Digest 100 Brightest Scientists Award, and the E.F. Burton Award for Contributions to Microscopy by a Young Scientist. Nestor also founded and was the first Director of the Electron Microscopy Center at Argonne National Laboratory, where he developed the first parallel EELS system to employ CCD array detectors, plasma cleaning technology for EM, and has received two R&D 100 Awards one for the invention of the Scanning Confocal Electron Microscope and the second for the ¹ sR X-ray Detector. He has and continues to hold numerous positions on local, national and international committees and engages the next generation of scientists through his adjunct work over the years with local universities (NIU , UofC, UIUC, UIC, IIT) as well as with middle and high school students through the Illinois Junior Academy of Science.
Nestor received his B.S. degree in Physics at Illinois Institute of Technology in Chicago, and his PhD in 1978 from the Department of Metallurgy at the University of Illinois Urbana-Champaign.
1978-present: Eugene P. Wigner
Fellow - Oak Ridge National Laboratory
1980-1983: Assistant Scientist
Materials Science Division Argonne National Laboratory
1983-2005: Scientist Materials
Science Division Argonne National Laboratory
1984-1994: Scientific Director and
Group Leader, Electron Microscopy Center, Argonne Nat. Lab.
2004-present: Senior Fellow
Computation Institute University of Chicago
2005-present: Senior Scientist,
Electron Microscopy Center, Argonne National
Laboratory
1985-present: Illinois Junior
Academy of Science Region 11 Organization Committee
1986-present: Coordinator MSA
Computer Workshop & Software Library
1987-1994: MSA Bulletin Editor
1987-1992: Editor Journal of
Electron Microscopy Technique
1988-present: Program Committee
Microscopy Society of America
1989-present: Education Committee Microscopy Society
of America
1990-present: Chair: Standards
Committee Microscopy Society of America
1990-2000: University of Illinois MatSEA Alumni Board of Directors
1990-present: Illinois Junior
Academy of Science-Board of Directors
1990-1994: Director Materials
Science Program: Midwest Society of EM
1992-1997: ASTM E-42 Standards
Committee
1992-1997: Chair: ISO Standards
Committee TC-202 on Analytical Electron Microscopy
1992-2006: Chair: ISO Standards
Working Group WG-202 on Data Management and Treatment
1993-1996: MicroBeam
Analysis Society Journal Editor
1994-1996: President Midwest
Microscopy and Microanalysis Society
1995: Program Chair Microscopy
& Microanalysis Meeting – Kansas City, Mo
1995: Editor Proceedings of
Microscopy & Microanalysis 1995
1996: Editor Proceedings of
Microscopy & Microanalysis 1996
1996: Program Chair Microscopy
& Microanalysis Meeting – Minneapolis, Mn
1997-present: Editorial Board
Journal of Microscopy and Microanalysis
1998-present: Editorial Board
Microscopy & Analysis
1998-2006: Energy
Science Network Steering Committee - DoE/BES Representative
2001-2010: ANL MCS Computer
Sciences Advisory Committee
2002-2005 : Director Materials Science
Section: Microscopy Society of America
2003-2006: LAC
Chair–Microscopy & Microanalysis Meeting Chicago-2006
2010-present: President–Elect, President,
Past-President Microscopy Society of America
1978: Eugene P. Wigner Research
Fellow - Oak Ridge National Lab
1982: Microscopy Soc. of America:
E.F. Burton Award for contributions to electron microscopy
1984: Science Digest: One of
America's 100 Brightest Scientists
1987: Distinguished Service Award
EMSA Bulletin.
1993: Member of the Year: Midwest
Society of Electron Microscopists
1995: Honorary Lifetime Member
Illinois Junior Academy of Science
1996: Presidential Citation:
Australian Society for Electron Microscopy
1997: University of Illinois
Alumni Association: Award for Service to the University
1998: Microscopy Society of
America: Distinguished Service
Award
2002: Elected as Microscopy
Society of America Council Member
2003: Microscopy Society of
America: Best Instrumentation Poster: SCEM
2003: R&D 100 Award: Scanning
Confocal Electron Microscope
2004: Australian Microscopy
Society: Distinguished Service Award
2004: Microscopy Society of
America: Traveling Poster Award – Insitu
Lorentz Stage for the TEM
2004: August K¿hler
Award: State Microscopical Society of Illinois
2005: University of Illinois,
College of Engineering - Distinguished University Alumni
2009: Fellow of the Microscopy Society
of America
2010: R&D 100 Award: The ¹ Steradian X-ray Detector for Electron-Optical Beam Lines.
2012: Presidential Science Award:
Microanalysis Society of America
Microscopy
Society of America (MSA): 1979-present
Microbeam Analysis Society (MAS): 1979-present
Australian
Society for Electron Microscopy: 1988-present
Midwest
Microscopy and Microanalysis Society: 1990-present
Microscopical Society of Canada: 1993-present
Royal Microscopical Society (U.K): 1992-1996
American
Society for Testing of Materials: 1992-1997
International
Standards Organization: 1992-present
1980-1984: Adjunct Assistant
Professor Dept. of Metallurgy Illinois Institute of Technology-Chicago
1980-1982: Adjunct Assistant
Professor Dept. of Metallurgy, University of Illinois-Urbana
1982-1984: Adjunct Associate
Professor Dept. of Metallurgy, University of Illinois-Urbana
1985-1997: Adjunct Professor Dept.
of Mat. Science and Engineering, University of Illinois-Urbana
1995-2001: Visiting Scientist
Dept. of Materials Science Cambridge University- UK.
1997-2010: Adjunct Professor of
Physics, University of Illinois at Chicago
1999-2010: Visiting Professor of
Physics, Northern Illinois University
2004-present: Senior Fellow
Computational Institute of the University of Chicago
2010-present: Adjunct Professor of
Physics, Northern Illinois University
Publications, Presentations, Patents,
Software Copyrights
Refereed Publications : Journals, Proceedings,
Books - 235
Copyrighted Software
-1
Microcharacterization of
Materials via Electron Microscopy/Microanalysis
Computationally
Mediated Experimental Science
Tele
Presence Collaboration and Distance Learning
Multimetallic Au/FePt3 Nanoparticles as Highly Durable Electrocatalyst
C. Wang,
Dennis van der Vliet, Karren
L. More, Nestor J. Zaluzec, Sheng Peng, Shouheng Sun,
Hideo Daimon, Guofeng Wang, Jeffrey
Greeley, John Pearson, Arvydas P. Paulikas,
Goran Karapetrov, Dusan Strmcnik, Nenad M. Markovic, and Vojislav
R. Stamenkovic
Nano Lett. 2011, 11, 919–926
dx.doi.org/10.1021/nl102369k
Ion irradiation of novel
yttrium/ytterbium-based pyrochlores: The effect of
disorder
Karl R. Whittle ,
Mark G. Blackford, Robert D. Aughterson, Gregory R.
Lumpkin,
Nestor J. Zaluzec Acta Materialia 59 (2011)
7530–7537 doi:10.1016/j.actamat.2011.09.021
On the Performance of XEDS and EELS in the AEM: 25 Years Later
Substantial
crystalline topology in amorphous silicon
J.
M. Gibson, M. M. J. Treacy, T. Sun, N.J. Zaluzec
Physical Review Letters –PRL 105, 125504 (2010) DOI: 10.1103/PhysRevLett.105.125504
Extracting physically
interpretable data from electron energy-loss spectra
C. Witte , N.J. Zaluzec , L.J.
Allen
Ultramicroscopy 110 (2010) 1390–1396 doi:10.1016/j.ultramic.2010.07.003
III-nitride nanopyramid
leds grown by organometallic vapor phase epitaxy
I. H. Wildeson, R. Colby, F. A. Ewoldt,
Z. Liang, D.N. Zakharov, N. J. Zaluzec, R. E. Garcia,
E. A. Stach and T. D. Sands1JOURNAL OF APPLIED
PHYSICS 108, 1 2010 doi: 10.1063/1.3466998
Radiation tolerance of
Mn+1axn phases, Ti3AlC2 and Ti3SiC2
K.R. Whittle, M.G.
Blackford, R.D. Aughterson, S. Moricca,
G.R. Lumpkin, D.P. Riley, N.J. Zaluzec
Acta Mater (2010), doi:10.1016/j.actamat.2010.04.029
Single Atom Detection by XEDS in the Aberration Corrected
AEM: Is it Feasible?
Nestor J. Zaluzec , Microsc Microanal 15(Suppl 2), 2009
458-459, doi: 10.1017/S1431927609095646
Innovative
Instrumentation for Analysis of Nanoparticles: The ¹ Steradian Detector
Nestor J. Zaluzec , Microscopy Today, Volume 17, Issue 4 Aug 2009, pp 56
– 59 10.1017S1551929509000224
Ion Irradiation of Ternary Pyrochlore Oxides
Gregory R. Lumpkin,*
Katherine L. Smith, Mark G. Blackford, and Karl R. Whittle, Elizabeth J. Harvey
and Simon A. T. Redfern, Nestor J. Zaluzec, Chem. Mater. (2009), 21, 2746–2754, DOI:10.1021/cm9003917
Detector
Solid Angle Calculations
for X-ray Energy
Dispersive Spectrometry
Nestor J. Zaluzec , Microscopy & Microanalysis , 15, 93-98, (2009) doi:10.1017/S1431927609090217
Nanometer-scale sharpness in corner-overgrown heterostructures L. Steinke, P. Cantwell, D. Zakharov, E. Stach, N. J. Zaluzec, A. Fontcuberta
i Morral, M. Bichler, G. Abstreiter, M. Grayson
Applied Physics Letters 93, #19 10.1063/1.2988526
(2008)
Single
Particle Plasmon Spectroscopy of Silver Nanowires and Gold Nanorods
Moussa NÕGom, Jan Ringnalda, John F.
Mansfield, Ashish Agarwal , Nicholas Kotov, and Nestor J. Zaluzec, Theodore B. Norris , Nano
Letters 8, #10 3200-3204 (2008) 10.1021/nl801504v