******************************
                  *          NEDQNT            *
                  * EDS DATA ANALYSIS PROGRAM  *
                  *       8706100020-NJZ       *
                  *     Modified for the       *
                  *        Mac by JFM          *
                  *   with Language Systems    *
                  *        MPW FORTRAN         *
                  * Remember CAPS LOCK and all *
                  *  elements & lines need 2   *
                  *  letters & numbers need    *
                  *      the decimal point     *
                  *   Toolbox Version in the   *
                  *           Works!           *
                  ******************************


 Data Analysis on: 25-JUL-89 at 18:01:21


PAUSE Note above and hit return to continue
 Which Detector did you use (High or Low) [L] 


 Si(Li) Detector/Microscope Parameters
 ________________________________________
 Parylene  thickness(cm)  =     1.0000E-05
 Aluminium thickness(cm)  =     0.0000E+00
 Beryllium thickness(cm)  =     0.0000E+00
 Gold      thickness(cm)  =     1.5000E-06
 Silicon Dead  layer(cm)  =     2.0000E-05
 Silicon Act.  layer(cm)  =     2.0000E-01
 X-ray Incid. Angle(deg)  =     0.0000
 Detector Azimuth  (deg)  =    90.0000
 Detector Elevation(deg)  =     0.0000
 Detector Solid Angle(Sr) =     0.0430
 FWHM of Mn K-alpha (eV)  =   171.0000
 Constant for Mn K-alpha  =     4.3000
 Incomplete Charge Const A=     0.0000
 Incomplete Charge Const B=     0.0000

 Enter Analysis/Specimen Identification :
TEST FOR COMPARISON WITH TFA

 ------------------------------
   SELECT Type of Calculation
 ------------------------------
  COMPOSITION from Intensity=C
  INTENSITY from Composition=I
  Enter your Choice [C] =

 Accelerating Voltage (kV)? :  200

 Number of Elements to be Analyzed ? :  2

 Enter Element,Line,Intensity of Peak Number  1  -[A2,A2,REAL]
NI,K ,50000.
NI K   50000.000

 Enter Element,Line,Intensity of Peak Number  2  -[A2,A2,REAL]
CU,K ,50000.
CU K   50000.000
           Int       Wt%    At%    Wt%-Ratio  At%-Ratio
--------------------------------------------------------

 NI K    5.000E+04  47.64  49.62    1.0000    1.0000 
 CU K    5.000E+04  52.36  50.38    1.0989    1.0154 

           Analysis by Thin Film Approximation
--------------------------------------------------------


 Absorption Correction? [Y] Y

 Enter Specimen Thickness (nm) along Beam Direction : 1000

 Enter  Specimen  Tilt:  X-Axis, Y-Axis  [ZZ,ZZ]    : 35,0

 Enter Specimen Density (Calculate by Averaging = 0.):

         Intensity    Wt%   At%    Wt%-Ratio  At%-Ratio
--------------------------------------------------------

 NI K  --------------47.82 49.80    1.0000    1.0000 
 CU K  --------------52.18 50.20    1.0911    1.0082 

           Analysis with Absorption Correction
--------------------------------------------------------

 Electron Incidence Angle =    55.00

 Thickness (nm)          =   1000.00
 Abs. Pathlength (nm)    =   1428.15
 Density                 =      8.93
 Iterations              =         1

   -> Thin Film Approx = XPT<0.1 <-

      XPT for NI K   =  0.079
      XPT for CU K   =  0.065

 Change Absorption Parameters? [N]:N
 Tabulate Element Parameters? [Y] :
N
 Tabulate Mass Abs. Coeff. [Y] : 
N
 Tabulate Detector/Microscope Parameters  [Y] : 
N
 Do you wish to Enter more Data? [N]

STOP