Title                  :MOCBEDON
Keywords               :CBED, Thickness, TEM Computer Control
Computer               :IBM PC
Operating System       :DOS
Programming Language   :Pascal
Hardware Requirements  :Philips CM Series Computer Interface
Author(s)              :M.T. Otten
Correspondence Address :Philips Analytical
                        :International Business Centre
                        :Electron Optics,Building AAE
                        :5600 MD Eindhoven,The Netherlands

Abstract:

CMCBEDON is an on-line computer program which allows the user of a
Philips CM series TEM/STEM to determine specimen thicknesses using
convergent beam electron diffraction patterns. Unlike CMCBEDOFF,
this program requires a Philips CM series computer/microscope
interfaces. Using interactive programing data required for
calculations is supplyed/measured directly from microscope. No micrographs are
therefore required.

July 1989
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