Title                  :MOCBEDOFF
Keywords               :CBED, Thickness, TEM Computer Control
Computer               :IBM PC
Operating System       :DOS
Programming Language   :Pascal
Hardware Requirements  :None
Author(s)              :M.T. Otten
Correspondence Address :Philips Analytical
                        :International Business Centre
                        :Electron Optics,Building AAE
                        :5600 MD Eindhoven,The Netherlands

Abstract:

CMCBEDOFF is an off-line computer program which allows the users
to determine specimen thicknesses using convergent beam electron
diffraction patterns. Users are prompted to input all relevant parameters
needed to perform thickness calculations. Unlike CMCBEDON, this program
requires no microscope interfaces and can be run on a standard PC, with users
supplying data measured from micrographs.

July 1989
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