Abstracts last updated DEC. 2. 1993

Nestor Z.
===========================================================================



Title                  :DIFFRACTIONSUITE
Keywords               :CBED, HOLZ, KINEMATICAL APPROXIMATION
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS
Programming Language   :Fortran 77
Hardware Requirements  :TEKTRONICS 4010 TERMINAL OR SUITABLE EMULATOR
Author(s)              :JOHN F. MANSFIELD (919)-248-1800
Correspondence Address :THE MICROELECTRONICS CENTER OF NORTH CAROLINA
                       :PO BOX 12889, RESEARCH TRIANGLE PARK, N.C. 27709.
Abstract:
	This set of software routines will calculate a data file of reciprocal 
lattice vectors for any crystal, when supplied with the lattice parameters and
the lattice type, and then plot simulated convergent beam electron diffraction
zone axis patterns (CBED ZAPs).  The simulations are currently limited to
plots of the zero layer discs, plots of the bright field deficiency higher
order laue zone lines and both of the above simultaneously.
	The manual for this suite of routines was written on an apple macintosh
using "macwrite", with examples of actual plots "pasted" into the text from the
terminal emulation program "versaterm".  A copy of the text of the manual 
resides in the emmpdl under the title "diffractionsuite.doc.
to receive a complete copy including figures, please send a blank macintosh
disk the author.
------------------------------------------------------------------------------

Title                  :MOCBEDOFF
Keywords               :CBED, Thickness, TEM Computer Control
Computer               :IBM PC
Operating System       :DOS
Programming Language   :Pascal
Hardware Requirements  :None
Author(s)              :M.T. Otten
Correspondence Address :Philips Analytical
                        :International Business Centre
                        :Electron Optics,Building AAE
                        :5600 MD Eindhoven,The Netherlands

Abstract:

CMCBEDOFF is an off-line computer program which allows the users
to determine specimen thicknesses using convergent beam electron
diffraction patterns. Users are prompted to input all relevant parameters
needed to perform thickness calculations. Unlike CMCBEDON, this program
requires no microscope interfaces and can be run on a standard PC, with users
supplying data measured from micrographs.

July 1989
-----------------------------------------------------------------------------

Title                  :MOCBEDON
Keywords               :CBED, Thickness, TEM Computer Control
Computer               :IBM PC
Operating System       :DOS
Programming Language   :Pascal
Hardware Requirements  :Philips CM Series Computer Interface
Author(s)              :M.T. Otten
Correspondence Address :Philips Analytical
                        :International Business Centre
                        :Electron Optics,Building AAE
                        :5600 MD Eindhoven,The Netherlands

Abstract:

CMCBEDON is an on-line computer program which allows the user of a
Philips CM series TEM/STEM to determine specimen thicknesses using
convergent beam electron diffraction patterns. Unlike CMCBEDOFF,
this program requires a Philips CM series computer/microscope
interfaces. Using interactive programing data required for
calculations is supplyed/measured directly from microscope. No micrographs are
therefore required.

July 1989
--------------------------------------------------------------------------

Title                  :STEREOPROJ
Keywords               :Stereographic Projection, CBED, SAD, TEM, AEM, HOLZ
Computer               :IBM PC/XT/AT or compatible
Operating System       :PC-DOS
Programming Language   :BASICA or QUICKBASIC (QUICKBASIC preferred)
Hardware Requirements  :Hewlett Packard HP7470A Plotter required.
Author(s)              :John R. Porter
Correspondence Address :Rockwell International Science Center,
                       :Thousand Oaks, CA 91360.
Abstract:
The program, written in IBM BASICA, plots stereographic projections, CBED and
HOLZ line simulations, and performs axis/angle pair calculations.  Output is to
the screen or a Hewlett Packard HP 7470A Plotter.  Stereographic projections
are drawn to scale for subsequent manipulations with a standard 18cm. Wulff net
and can be plotted for cubic, hexagonal, tetragonal and monoclinic crystal
systems in any orientation.  Plotted poles can be restricted to those allowed
by structure factor considerations (for certain structures) or restricted to
those in certain Laue zones.  The program leads the user through menus to
determine the structure and orientation for the projection, which is then
plotted accordingly.  Version 4.00 is significantly enhanced compared to
earlier versions.  Screen output is improved, more crystal structures are
supported the user interface is more forgiving and the program is faster.
Also, the HOLZ line routine has been modified and should be more accurate.
---------------------------------------------------------------------------

Title                  :STERPROJ_IBM_V4
Keywords               :Stereographic Projection, CBED, SAD, TEM, AEM, 
HOLZ
Computer               :IBM PC/XT/AT or compatible
Operating System       :PC-DOS
Programming Language   :QUICKBASIC 4.5
Hardware Requirements  :Hewlett Packard HP7470A Plotter required.
Author(s)              :John R. Porter
Correspondence Address :Rockwell International Science Center,
                       :Thousand Oaks, CA 91360.
Abstract:

This QuickBASIC program plots stereographic projections, CBED and
HOLZ line simulations, and performs axis/angle pair calculations.  
Output is to the screen or a Hewlett Packard HP 7470A Plotter.  Stereographic 
projections are drawn to scale for subsequent manipulations with a standard 
18cm. Wulff net and can be plotted for cubic, hexagonal, tetragonal and 
monoclinic crystal systems in any orientation.  Plotted poles can be 
restricted to those allowed by structure factor considerations (for certain 
structures) or restricted to those in certain Laue zones.  The program 
leads the user through menus to determine the structure and orientation  
for the projection, which is then plotted accordingly.  Version 4.00 is 
significantly enhanced compared to earlier versions.  

EDITORS NOTE:  THIS IS A NEW UPDATED VERSION OF STERPROJ- IBM  
(FEB.1990)
-----------------------------------------------------------------------------

Title:		STERPROJ_MAC
Keywords:	Stereographic Projection, CBED, SAD, TEM, AEM, HOLZ
Computer:	Macintosh Plus or II
Language:	QuickBASIC for Macintosh
Hardware:	Hewlett Packard HP7470A Plotter or Laserwriter
Author:		John R. Porter
Address:	Rockwell International Science Center, Thousand Oaks
		CA 91360

Abstract:

Stereographic Projection for Macintosh is the Macintosh version of the
STERPROJ program previously available for the PC.  The program plots
stereographic projections, CBED simulations, HOLZ line patterns and
performs axis/angle pair calculations.  The program supports cubic,
hexagonal, tetragonal and monoclinic crystal systems.  Separate
executable versions are included for Mac Plus and Mac II (SPMAC+.EXE and
SPMACII.EXE).  The .DOC file is in Macwrite format.  Sample data files are
also included (extension .MACXTL).
---------------------------------------------------------------------------

Title                   :TCBED
Keywords                :CBED
Computer                :VAX, Macintosh, Machine independent
Operating System        :Any
Programming Language    :Fortran 77
Hardware Requirements   :Line printer
Author(s)               :J.M. Zuo and J.C.H. Spence
Correspondence Address  :Physics Dept, Arizona State Univ., Tempe, AZ 85287, USA
Abstract:
         A Transmission Convergent Beam Electron diffraction program which
simulates the two-dimensional distribution of intensity in CBED disks. The
program includes three-dimensional (HOLZ) diffraction for non-centrosymmetric
crystals with absorption and inclined boundaries. It uses Bloch wave (matrix
diagonalization for general complex matrix) method. A complete description,
source code and test data are given in J. Elec. Micros. Tech., May, 1989
(Zuo et al). An application to GaAs can be found in Phys. Rev. Lett., Vol 61,
P353 (1988). The program produces a numerical output file and a two-digits
intensity map on line printer.
----------------------------------------------------------------------------- 

Title                  :DOSE
Keywords               :Electron Dose Measurement, TEM Computer 
Control
Computer               :IBM PC
Operating System       :DOS
Programming Language   :Pascal
Hardware Requirements  :Philips CM Series Computer Interface
Author(s)              :M.T. Otten  
Correspondence Address :Philips Analytical
				:International Business Centre
				:Electron Optics,Building AAE
				:5600 MD Eindhoven,The Netherlands

Abstract:            

Dose is an on-line computer program which allows the user of a 
Philips CM series TEM/STEM to determine specimen electron irradiation 
dose through the use of the Philips CM Series Computer Interface. Simple
interactive questions allow the user to determine experimentally the 
nominal irradiation dose from screen current measurements.

                         
Feb.  1990
---------------------------------------------------------------------------

Title                  :DYNADF 
Keywords               :Dark Field, TEM Computer Control
Computer               :IBM PC
Operating System       :DOS
Programming Language   :Pascal
Hardware Requirements  :Philips CM Series Computer Interface
Author(s)              :M.T. Otten  
Correspondence Address :Philips Analytical
			:International Business Centre
			:Electron Optics,Building AAE
			:5600 MD Eindhoven,The 
Netherlands

Abstract:            

DYNADF is an on-line computer program which allows the user of a 
Philips CM series TEM/STEM to simulate the  Dynamic Annular Dark Field
operating mode. DYNADF.COM simulates for the CM TEM the Dynamic 
Conical Dark Field mode as it is available on the CM/STEM microscope. In the 
latter, the presence of the scan generator allows continuous scanning of 
the beam in a hollow cone. Since the CM TEM doesn't have a scan generator, 
the Dynamic mode is not available, but a similar effect can be obtained 
by  continuously turning the MULTIFUNCTION X knob under computer control. 
                         
Feb. 1990
---------------------------------------------------------------------------

Title                  :MOAUTOCOND
Keywords               : TEM Computer Control
Computer               :IBM PC
Operating System       :DOS
Programming Language   :Pascal
Hardware Requirements  :Philips CM Series Computer Interface
Author(s)              :M.T. Otten
Correspondence Address :Philips Analytical
                        :International Business Centre
                        :Electron Optics,Building AAE
                        :5600 MD Eindhoven,The Netherlands

Abstract:

AUTOCOND is an on-line computer program which allows the user of a
Philips CM series TEM/STEM to automatically condition the High Voltage
of a CM20/CM30 instrument using remote computer control.

JAN. 1992
--------------------------------------------------------------------------

Title                  :ONEDISANL
Keywords               :CTEM, DISOLOCATIONS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :R. J. Holton 
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract:

ONEDISANL is a modified version of the original ONEDIS program developed
by the group of A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton and
C.T. Forwood at CSIRO Division of Tribophysics, University of Melbourne, 
Autralia for calculating disolcation images for the TEM. This version
modifies only their output algorithms for output to a serial data file rather
than overprinting upon a line printer. Using the included program (IMOUT) 
this can then be displayed as a randomized dither pattern on a DEC LA100 or 
LA50 printer
-------------------------------------------------------------------------------
                       
Title                  :TWODISANL
Keywords               :CTEM, DISOLOCATIONS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :R. J. Holton 
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract:

TWODISANL is a modified version of the original TWODIS program developed
by the group of A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton and
C.T. Forwood at CSIRO Division of Tribophysics, University of Melbourne, 
Autralia for calculating disolcation images for the TEM. This version
modifies only their output algorithms for output to a serial data file rather
than overprinting upon a line printer. Using the included program (IMOUT) 
this can then be displayed as a randomized dither pattern on a DEC LA100 or 
LA50 printer
-------------------------------------------------------------------------------
                       
Title                  :$$EELSDATA
Keywords               :EELS SPECTRA
Computer               :All systems
Operating System       :None
Programming Language   :None
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract:

Experimental EELS spectra are now available in the EMMPDL. 
They are generally titled in the form of:

	$NAME.PDL

Where the notation PDL indicates that they are ASCII files stored in the 
EMMPDL data format (see RWEMMPDL.ABS). To locate these files set your
DIR.FILENAME.FILETYPE to EELS.*.PDL in the Menu Options of the EMMPDL.
You may access and transfer these file by all telecommunications options.
-------------------------------------------------------------------------------

Title					:ELSKKT
Keywords				:EELS,CTEM,OPTICAL PROPERTIES
Computer				:11/730-785
Operating System			:Vax/Vms
Programing Language			:Fortran IV
Hardware Requirements  			:None
Author(s)              			:Alex H. Buxbaum
Correspondence Address			:Department of Materials Engineering,
					Technion- Israel Institute of Technology
					Haifa 32000, Israel.
Abstract:

ELSKKT is program written for the purpose of obtaining the loss function 
and dielectric constant (real and imaginary parts) of materials, from 
Electron Energy Loss (EELS) spectra obtained in the transmission electron 
microscope.  Usefull data generally begines around 8eV, for an instrument
 with a resolution of 2 eV.  After correcting for multiple scattering, data
is treated by using the Kramers-Kronig Analysis.
---------------------------------------------------------------------------


Title                  :EMMFF V. 1.0
Keywords               :XEDS,EELS,AES,WDS,CLS,GAM,XRF,PES
Computer               :IBM, MAC, DEC
Operating System       :ALL
Programming Language   :Fortran 77
Hardware Requirements  :None
Author(s)              :EMSA/MAS TASK FORCE
                        Ray Egerton ,Charles E. Fiori ,John A. Hunt,
			Mike S. Isaacson,Earl J. Kirkland ,Nestor J. Zaluzec 
Correspondence Address :R.F. EGERTON-CHAIRMAN
			University of Alberta
			Dept. of Physics
			Edmonton, Alberta, Canada, T6G2J1
Abstract:

	A simple format for the exchange of digital spectral data is 
presented, and proposed as an EMSA/MAS standard.  This format is readable by 
both humans and computers and is suitable for  transmission through various 
electronic networks (BITNET, ARPANET), the phone system (with modems) or on 
physical computer storage devices (such as floppy disks).  The format is not 
tied to any one computer, programming language or computer operating system.  
The adoption of a standard format would enable different laboratories to freely 
exchange spectral data, and would help to standarize data
analysis software. If equipment manufacturers were to support a common format, 
the microscopy and microanalysis community would avoid duplicated effort in 
writing data-analysis software. This version of EMSAMASFF contains two 
subroutines which read and write spectral data files  Version 1.0 data format. 
The data are stored as simple ASCII characters at a user defined number of 
columns per line for the  length of the data file. The spectral data is 
preceeded by a series of header lines, which tell the user about the 
parameters of the spectrum. The header lines are identified by the first 
character in the line being the symbol (#) followed by a descriptor  and if 
appropriate its units. An example of a data file format can be found in the 
EMSAMASFF.DOC file. 
------------------------------------------------------------------------------


Title                  :NELSV21
Keywords               :EELS
Computer               :DEC VAX-11/730 - 11/785 or higher series
Operating System       :VMS
Programming Language   :Fortran IV
Hardware Requirements  :Tektronics 4010 Series Graphic Terminal or Emulator
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Electron Microscopy Center, Materials Science, Bldg 212
                       :Argonne Nat. Lab, Argonne, IL. 60439 USA
Abstract:            

NELS is a generic data analysis computer program for reduction of EELS
spectra. The program performs the functions of spectral calibration, KLM edge
identification, background fitting & subtraction, edge integration, digital 
filtering, and general spectral maniputlation. The input spectra are assumed 
to be in the EMMPDL spectral file format (see RWEMMPDL.ABS). The program can 
handle simultaneously three spectra of upto 4096 channels in length.  A shorter
and less elaborate version is available for smaller DEC computers running
RT-11.  The program NELS requires a computer terminal which responds to the
graphics protocol of Tektronics 4010/4014 series terminal (see NGRAPH.ABS)
and an atomic inner shell energy level data file (see ATMLVL.ABS).
---------------------------------------------------------------------------

Title                  :NTLAMDA
Keywords               :EELS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec (312-972-5075,4964)
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract:
 
NTLAMDA  is a simple fortran program which allows the user to calculate the
approximate thickness of a specimen based upon the measured EELS spectral
intensity ratio Io/It, which can be shown to be equal to the ratio of the
local thickness (t) to the mean free path for inelastic scattering (lamda).
The formulae are based upon the work of Egerton and Cheng (Ultramicroscopy, 21,
1987 pge 231-244), but has been generalized to simplify data input and entry.
The user must know the nominal elemental constitutents of the specimen, and is
prompted for all necessary input parameters required for the calculation.
---------------------------------------------------------------------------

Title                  :NTRANS
Keywords               :XEDS, EELS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract:

NTRANS is a computer program which translates manufacturers XEDS and EELS 
spectral data into the EMMPDL data format. It utilies the RWEMMPDL subroutines
contained in the EMMPDL. At present this version translates both EDAX and
TRACOR-Northern and Link Systems data files. Examples of translated spectra 
can be found spectra  can be found in the XEDS and EELS subdirectories of 
the EMMPDL.
-------------------------------------------------------------------------------

Title                  :PINT
Keywords               :EELS - planar interface calculations
Computer               :VAX 780
Operating System       :VAX/VMS version 4.7
Programming Language   :FORTRAN 77
Hardware Requirements  :Tektronics 4010 series graphic terminal or emulator
                        desirable but not essential.
Author(s)              :C.A. Walsh - based on a BASIC program written by
                        A. Howie.
Correspondence Address :Microstructural Physics Group, Cavendish Laboratory,
                        Madingley Road, Cambridge, CB3 0HE, England.
Abstract:
   The program uses the result obtained by Garcia-Molina, Gras-Marti, Howie and
Ritchie (J. Phys. C18 (1985) pp5335) to calculate the energy loss of electrons
travelling parallel to a planar interface. They obtained an expression for the 
differential probability dP/(dzdhf), for an electron travelling in the z 
direction and losing energy hf. The probability of losing energy between 
hf-dhf/2 and hf+dhf/2 after travelling a distance dz parallel to the interface 
is given by dP/(dzdhf) x dzdhf. The program also uses this result to calculate 
the energy loss of electrons incident at an angle to an interface (see Howie, 
Milne and Walls,(1985) Inst.Phys. Conf. Ser. No. 78: Chapter 4, EMAG'85). The 
program requires dielectric data for the media on either side of the interface. 
A limited amount of data is stored inside the program for some materials. Other 
data can be supplied to the program by data files.
---------------------------------------------------------------------------

Title                  :PTEELS
Keywords               :EELS,AEM,CTEM,STEM,BACKGROUND,STATISTICS
Computer               :DEC LSI-11/73
Operating System       :RSX-11M-PLUS
Programming Language   :DEC-FORTRAN IV
Hardware Requirements  :None
Author(s)              :Dr. Pierre TREBBIA
Correspondence Address :Laboratoire de Physique des Solides
                       :Bat. 510, F91405 ORSAY CEDEX FRANCE
Abstract: We present an unbiased method for the estimation of the background in
EELS spectra. It looks for the maximum likelihood of a power law model whose
two dependent parameters A and R are estimated together with their variances
and covariance. Applying the usual rules of error propagation, core-loss
characteristic signals and their variances are estimated. Results can be used
as input data for the programs QUANTI and LIMIT which are also provided by the
EMMPDL facility. A complete description of the algorithm is given in "Unbiased
Method for Signal Estimation in Electron Energy Loss Spectroscopy...",
P. TREBBIA, Ultramicroscopy (1988).
---------------------------------------------------------------------------

Title                  :PTETHA
Keywords               :EELS,STEM,COLLECTION EFFICIENCY,CONVERGENT BEAM
Computer               :DEC LSI-11/73
Operating System       :RSX-11M-PLUS
Programming Language   :DEC-FORTRAN IV
Hardware Requirements  :None
Author(s)              :Dr. Pierre TREBBIA
Correspondence Address :Laboratoire de Physique des Solides
                       :Bat. 510, F91405 ORSAY CEDEX FRANCE
Abstract: When EELS spectra are recorded with a convergent beam (STEM case), 
one has to compute an effective collection angle BETA* which should be used in 
computing the interaction cross sections, instead of the actual collection 
angle BETA. This is the job of program ETHA.
    A complete description of the algorithm is given in "Unbiased 
Method for Signal Estimation in Electron Energy Loss Spectroscopy...", 
P. TREBBIA, Ultramicroscopy (1988).
---------------------------------------------------------------------------

Title                  :PTLIMIT
Keywords               :EELS,EDX,AEM,CTEM,STEM,DETECTION LIMITS,STATISTICS
Computer               :DEC LSI-11/73
Operating System       :RSX-11M-PLUS
Programming Language   :DEC-FORTRAN IV
Hardware Requirements  :None
Author(s)              :Dr. Pierre TREBBIA
Correspondence Address :Laboratoire de Physique des Solides
                       :Bat. 510, F91405 ORSAY CEDEX FRANCE
Abstract: When one tries to detect an element with a very small SIGNAL/NOISE 
ratio, one has to face with two main risks :

FIRST KIND RISK : state the element is present when actually it is absent.
SECOND KIND RISK : state the element is absent when actually it is present.

This program gives for two first kind risks (0.05 and 0.01) and four second 
kind risks (0.25, 0.10, 0.05 and 0.01) the resulting 8 possible values of 
minimum SIGNAL and SIGNAL/NOISE ratio.

    A complete description of the algorithm is given in "Unbiased 
Method for Signal Estimation in Electron Energy Loss Spectroscopy...", 
P. TREBBIA, Ultramicroscopy (1988).
---------------------------------------------------------------------------

Title                  :PTQUANTI
Keywords               :EELS,EDX,AEM,CTEM,STEM,CONCENTRATIONS,STATISTICS
Computer               :DEC LSI-11/73
Operating System       :RSX-11M-PLUS
Programming Language   :DEC-FORTRAN IV
Hardware Requirements  :None
Author(s)              :Dr. Pierre TREBBIA
Correspondence Address :Laboratoire de Physique des Solides
                       :Bat. 510, F91405 ORSAY CEDEX FRANCE
Abstract: The purpose of this program is quite general. It can be used not only 
for the determination of atomic concentrations in EELS experiments, but also, 
for example, for the determination of weight concentrations in EDX 
spectroscopy. For given SIGNAL, BACKGROUND, H = 1 + VARIANCE(BACK)/BACKGROUND 
and F = Interaction-detection yield (in arbitrary units) values, it returns 
concentrations values, concentration covariances and confidence intervals at 
three different confidence levels : 0.1, 0.05 and 0.01.
    A complete description of the algorithm is given in "Unbiased 
Method for Signal Estimation in Electron Energy Loss Spectroscopy...", 
P. TREBBIA, Ultramicroscopy (1988).
---------------------------------------------------------------------------

Title                  :PTSELECT
Keywords               :STATISTICS,MEAN VALUE,SELECTION TEST
Computer               :DEC LSI-11/73
Operating System       :RSX-11M-PLUS
Programming Language   :DEC-FORTRAN IV
Hardware Requirements  :None
Author(s)              :Dr. Pierre TREBBIA
Correspondence Address :Laboratoire de Physique des Solides
                       :Bat. 510, F91405 ORSAY CEDEX FRANCE
Abstract: Let us suppose that we obtained N estimations Vi (i=1,N) of a same 
unknown X. If we know the variance and covariance matrix of the Vi, one can 
compute the mean value (estimation of X) and the confidence limits of this 
mean. One can then check whether the Vi are valid measurements or whether one 
of them (at least) must be removed from the measurement set.
      This program SELECT is of general purpose and can be used as a valuable 
substitute to the general method of the "bad-looking" rejection criterion.
      A complete description of the algorithm is given in "Unbiased 
Method for Signal Estimation in Electron Energy Loss Spectroscopy...", 
P. TREBBIA, Ultramicroscopy (1988).
---------------------------------------------------------------------------

Title                  :RWEMMDPL 
Keywords               :XEDS, EELS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract:

	RWEMMPDL contains two subroutines which read and write spectral data 
files (XEDS or EELS) in the EMMPDL Version 1.1 data format. The data are stored
as simple ASCII characters at a user defined number of columns per line for the 
length of the data file. The spectral data is preceeded by a series of header 
lines, which tell the user about the parameters of the spectrum. The header 
lines are identified by the first character in the line being the symbol (#) 
followed by a four letter descriptor  and if appropriate its units. An example
of a data file format can be found in the RWEMMPDL.DOC file. Other  examples
spectra  can be found in the XEDS and EELS subdirectories of the EMMPDL.
-------------------------------------------------------------------------------

Title                  :TRANSPORT
Keywords               :Optics, Quadropoles, Sextapoles, Bending Magnets, EELS
Computer               :DEC VAX 11/730-785
Operating System       :VAXVMS, 
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :K.L.Brown, F.Rothacker D.C., Carey, Ch. Iselin
Correspondence Address :Stanford linear Accelerator Center, Stanford CA. USA 
                       :Fermi National Accelerator Lab. Batavia, IL. USA
		       : CERN, Geneva, Switzerland
Abstract:            
Transport is a computer code which calculates charged particle trajectories
using first and second-order matrix multiplication methods for the design
of static electromagnetic beam-line systems.   It has been in existence in 
various versions since 1963.  It is capable of computing a wide range of 
operating characteristics of electromagnetic systems including
Quadrupoles, Sextupoles, Solenoids, Bending Magnets etc.  and such can be
used to calculate the optics of many EELS systems.  Specific instructions
on the use of TRANSPORT are extensive and should be obtained from: The Reports
Office, Fermi National Accelerator Laboratory, P.O. Box 500, Batavia IL
60510, USA (Ref. NAL-91, "Transport Appendix")
------------------------------------------------------------------------------

Title                  :NGRAPH 
Keywords               :GRAPHICS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :TEKTRONICS 4010 terminal or an EQUIVALENT emulator
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,  Bldg  212
                       :Materials Science Division, Argonne, Illinois 60439, USA
Abstract: 

This subroutine  library  provides  graphics  functions  for  Tektronics  4010-1
terminals   and/or  their  emulators.   The  current  terminals  supported  are:
Tektronics 4010-1,4014-1, Lear Siegler ADM-3,ADM-5 (with  Retrographics  RG-512)
Peritek VCG-512 bit map color graphics, Tektronics 4027, HP 7470A/7475A plotters
DEC LA100/LA50 printers, Intecolor VT-100 with TEK  4010-1,4014-1,  4027  modes,
DEC  VT-200  with  4010-1,4014-1  mode,  Tektronics  4105/4107 with VT-100 mode,
Plessey VT-100/TEK 4010-1, Espirit VT-100/TEK 4010-1,  Tektronics  4695  Copier.
The  computer  program NGTEST is a fortran demonstration program which exercises
this graphics package.  The purpose of this graphics library  is  to  provide  a
standard  set  of  routine for producing x-y plots of XEDS and EELS data for the
analysis programs NEDS, NELS and graphics for plotting CBED patterns.
---------------------------------------------------------------------------

Title                  :NGTEST (Demonstration Program) - Abstract
Keywords               :GRAPHICS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :TEKTRONICS 4010 terminal or an EQUIVALENT emulator
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,  Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439, USA

Abstract: 

The computer program NGTEST is a fortran demonstration program  which  exercises
the  NGRAPH library package.  It demonstrates the symbol plotting, x-y plotting,
vector plotting, hardcopy output and cursor control subroutines available in the
package.  It requires that a file TERMIN.DAT exist on the default storage device
named DAT:.  A copy of the file TERMIN.dat can be found in the documentation  of
the NGRAPH routines.
---------------------------------------------------------------------------

Title: 				ATMSCAT
Keywords:		 	High Energy Electron Diffraction, Absorption
Computer: 			Any with F77 compiler
Operating System: 		Any
Programming Language: 		Standard Fortran 77
Hardware Requirements: 		none
Author(s): 			Q. A. King and D. M. Bird
Correspondence Address: 	School of Physics, University of Bath, 
					Bath BA2 7AY, UK.
Email: d.bird@gdr.bath.ac.uk (Internet)

Abstract:
Atom is a subroutine which when passed the name of an element,  the 
length of a g-vector and a Debye-Waller factor will compute and return
 both the real and absorptive atomic scattering factors, which can then
 be incorporated into any existing diffraction program. All the data is
 self-contained within the subroutine, documentation may be found at the
 head of the subroutine.  
---------------------------------------------------------------------------
  
Title:                  FSCATT
Keywords:               High Energy Electron Diffraction, Absorption
Computer:               Any with F77 compiler
Operating System:       Any
Programming Language:   Standard Fortran 77
Hardware Requirements:  none
Author(s):              Andreas Weickenmeier
Address:                Institut fuer Angewandte Physik der TH
                        Hochschulstrasse 6
                        W-6100 Darmstadt, GERMANY
Email:                  XLTODA6L@DDATHD21.BITNET

Abstract:
The subroutine FSCATT calculates the real part and the phonon
contribution to the absorptive part of the atomic scattering
factor for any element from He to Cf. The real part is obtained
by a new analytical fit to the tabulated Doyle and Turner
(Acta Cryst. A24 (1968) 133 - 139), Doyle and Cowley (Intern.
Tables of X-ray Crystallography, Vol. IV (1991) 152 - 174) and
Fox and O'Keefe (Acta Cryst. A45 (1989) 786 - 793) values. For
the computation of the absorptive part an Einstein model is used.
More details can be found in Weickenmeier and Kohl, Acta Cryst.
A47 (1991) 590 - 597.
Title                  :DMOTTCS
Keywords               :Sputtering,Defects,Displacement Damage,EELS,XEDS,HVEM
Computer               :DEC VAX 11/785
Operating System       :VAX/VMS
Programming Language   :VAX Fortran
Hardware Requirements  :None
Author(s)              :Charles R. Bradley
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,  Bldg  212
                       :Materials Science Division, Argonne, Illinois 60439, USA
Abstract:
	This program calculates differential Mott cross-sections of
elemental nuclei in collisions with relativistic electrons. These
cross-sections are useful in the study of displacement damage and
electron transmission sputtering. For medium and high voltage transmission
electron microscopes now available, having clean vacuum systems and high
brightness sources, modification of sample composition due to sputtering
and/or displacement by the probe will become an important consideration
during microanalysis or imaging.

Title                  :RECOIL
Keywords               :Sputtering,Defects,Displacement Damage,EELS,XEDS,HVEM
Computer               :DEC VAX 11/785
Operating System       :VAX/VMS
Programming Language   :VAX Fortran
Hardware Requirements  :None
Author(s)              :Charles R. Bradley
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,  Bldg  212
                       :Materials Science Division, Argonne, Illinois 60439, USA
Abstract:
	This program calculates differential Mott cross-sections of elemental
nuclei in collisions with relativistic electrons. The cross-sections are
output as functions of the nuclear recoil angle and are proportional to the
probability that a nucleus will recoil in a given direction.  These
cross-sections are useful in the study of displacement damage, electron
transmission sputtering, electron beam mixing, and recoil implantation.  For
medium and high voltage transmission electron microscopes now available,
having clean vacuum systems and high brightness sources, modification of
sample composition due to sputtering and/or displacement by the probe will
become an important consideration during microanalysis or imaging.
---------------------------------------------------------------------------

Title                  :TOTCS
Keywords               :Sputtering,Defects,Displacement Damage,EELS,XEDS,HVEM
Computer               :DEC VAX 11/785
Operating System       :VAX/VMS
Programming Language   :VAX Fortran V4.0
Hardware Requirements  :None
Author(s)              :Charles R. Bradley
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,  Bldg  212
                       :Materials Science Division, Argonne, Illinois 60439, USA
Abstract:
	This program calculates displacement cross-sections that are useful
in estimating the amount of sputtering and displacement damage due to
collisions of relativistic electrons with nuclei in elemental samples. The
total displacement cross-section is obtained by evaluating the differential
Mott cross-section and numerically integrating over the range of allowed
angles.  An upper limit for cascade cross-sections is evaluated in version 2.0. 
For the medium and high voltage electron microscopes now available, having
clean vacuum systems and high brightness sources, modification of sample
composition due to sputtering and/or displacement by the probe will become
an important consideration during microanalysis or imaging. This program allows
the analyst to estimate the potential adverse effects on the specimen prior
to study in the TEM.
---------------------------------------------------------------------------

Title                  :GIFSTD
Keywords               :Image Storage
Computer               :All Computers
Operating System       :All Computers
Programming Language   :None
Hardware Requirements  :None
Author(s)              :ComputerServe (Information Submitted by M. Disko)
Correspondence Address :5000 Arlington Centre Blvd.
                       :Columbus, Ohio 43220   (614) 457-8600
Abstract:            
	A device independent file format for image file storage and 
transmission is presented. This file format is copyrighted by ComputerServe.

Editors Note: It is proposed that this file format be adopted by the EMMPDL 
for image storage and transmission. 
----------------------------------------------------------------------------

Title                  :HTPSG
Keywords               :IMAGE PROCESSING, HALFTONE, POSTSCRIPT
Computer               :VAX
Operating System       :VMS
Programming Language   :DEC FORTRAN 77 V4.8
Hardware Requirements  :PostScript compatible printer
Author(s)              :Mark M. Disko
Correspondence Address :140 Fairview Avenue
                       :High Bridge, New Jersey  08829

	"HTPSG.DOC"  -   HalfTone PostScript Generic
	                 |   |    |   |      |

This is the routine for you if you would like to display calculated images
on a PostScript compatible printer.  Data is read in from an ASCII text file.
Several dispay options are supported including image box layout, halftone
screen type and spacing, text labels, and a micron marker bar.

File ICOS128.SRC contains a 128 x 128 pixel image that can be used to 
demonstrate the output capabilities of HTPSG.
---------------------------------------------------------------------------


Title                  :ICOS128
Keywords               :IMAGE PROCESSING, HALFTONE, POSTSCRIPT, ICOSAHEDRAL
Computer               :VAX
Operating System       :VMS
Programming Language   :DEC FORTRAN 77 V4.8
Hardware Requirements  :PostScript compatible printer
Author(s)              :Mark M. Disko
Correspondence Address :140 Fairview Avenue
                       :High Bridge, New Jersey  08829

This is a data file for program HTPSG which consists of a 128 x 128
pixel image of the five-fold axis diffraction pattern in the Al-Mn
icosahedral phase.  Image data is stored with 32 two digit hex values
per line.

See HTPSG.DOC and HTPSG.SRC for more on the data file format used by
program HTPSG for HalfTone PostScript Generic display of images on 
PostScript equipped display devices.
---------------------------------------------------------------------------


Title                  :IMAGEV103
Keywords               :Image Processing
Computer               :MACII
Operating System       :Mac
Programming Language   :Pascal
Hardware Requirements  :8 bit Video
Author(s)              :Wayne Rasband                   
Correspondence Address :National Institues of Health
                       :Bldg 36, Room 2A-03, Bethesda, Md.20892
		       :BITNET:WSR@NIHCU

Image is a program for the Macintosh II for doing digital image processing and 
analysis. It can acquire, enhance, measure, edit, animate, print and pseudo-
color images.  It reads and writes TIFF and PICT files, providing compatibility 
with many other Macintosh programs, including ImageStudio, PixelPaint, and 
Digital Darkroom. It supports many standard image processing functions including
histogram equalization, contrast enhancement, density profiling, smoothing, 
sharpening, edge detection, and noise reduction. It can measure lengths and 
x-y coordinates, and compute the average density and area of user defined 
regions of interest. Length and area measurements results can be calibrated 
to provide real world values.
-------------------------------------------------------------------------------

Title                  :IMAGE114B
Keywords               :Image Processing
Computer               :MACII
Operating System       :Mac
Programming Language   :Pascal
Hardware Requirements  :8 bit Video
Author(s)              :Wayne Rasband                   
Correspondence Address :National Institues of Health
                       :Bldg 36, Room 2A-03, Bethesda, Md.20892
		       :BITNET:WSR@NIHCU

Image is a program for the Macintosh II for doing digital image processing and 
analysis. It can acquire, enhance, measure, edit, animate, print and pseudo-
color images.  It reads and writes TIFF and PICT files, providing compatibility 
with many other Macintosh programs, including ImageStudio, PixelPaint, and 
Digital Darkroom. It supports many standard image processing functions including
histogram equalization, contrast enhancement, density profiling, smoothing, 
sharpening, edge detection, and noise reduction. It can measure lengths and 
x-y coordinates, and compute the average density and area of user defined 
regions of interest. Length and area measurements results can be calibrated 
to provide real world values.
-------------------------------------------------------------------------------

Title                  :IMAGE125
Keywords               :Image Processing
Computer               :MACII
Operating System       :Mac
Programming Language   :Pascal
Hardware Requirements  :8 bit Video
Author(s)              :Wayne Rasband                   
Correspondence Address :National Institues of Health
                       :Bldg 36, Room 2A-03, Bethesda, Md.20892
		       :BITNET:WSR@NIHCU
Abstract:

Image is a program for the Macintosh II for doing digital image processing and 
analysis. It can acquire, enhance, measure, edit, animate, print and pseudo-
color images.  It reads and writes TIFF and PICT files, providing compatibility 
with many other Macintosh programs, including ImageStudio, PixelPaint, and 
Digital Darkroom. It supports many standard image processing functions including
histogram equalization, contrast enhancement, density profiling, smoothing, 
sharpening, edge detection, and noise reduction. It can measure lengths and 
x-y coordinates, and compute the average density and area of user defined 
regions of interest. Length and area measurements results can be calibrated 
to provide real world values.
EDITORS NOTE:  THIS IS A NEW UPDATED VERSION OF IMAGE (FEB.1990)
-------------------------------------------------------------------------------

Title                  :ATMLVL
Keywords               :XEDS, EELS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract: 
	ATMLVL.DAT is a data file containing all inner shell edge energies
for elements in the range of H (Z=1) to FM (Z=100). The table is stored as
simple ASCII characters to allow simple access and file transfer.  Each element
contains 24 entries which correspond to the following shells K, L3, L2, L1, M5,
M4, M3, M2, M1, N7, N6, N5, N4, N3, N2, N1, O5, O4, O3, O2, O1, P1, P2, and P3.
If an element doesnot have a particuliar edge its energy is listed as zero.
The program BATMLVL, which is given in the ATMLVL.SRC file, can be used
to create an efficient binary file from this ASCII listing, while the subroutine
ELEDGE can be used in a user written program to read the resulting binary file.
------------------------------------------------------------------------------

Title                  :CLEDX
Keywords               :EDXS quantitative analysis, Cliff-Lorimer
Computer               :IBM PC family or clones
Operating System       :Microsoft DOS 3.x or higher
Programming Language   :Microsoft FORTRAN Optimizing compiler 4.10
                       :(large library, math-coprocessor emulator mode)
Hardware Requirements  :None
Author(s)              :Pierre TREBBIA
Correspondence Address :Laboratoire de Physique des Solides, Bat. 510
                       :F91405 ORSAY CEDEX FRANCE.
                       :Email : Bitnet address : TREBBIA@FRUPS51
 
Abstract:
 
From experimental conditions (angles, detection system, primary voltage,
line intensities & backgrounds), this program computes the weight &
atomic concentrations of up to 20 elements in a thin film X-Ray analysis
experiment using the Cliff-Lorimer procedure. An estimation of the
confidence intervals on the concentrations, for different first kind
risks, is also given. No special hardware is needed (i.e. math coprocessor
or graphic monitor). Results can be directed either to a lineprinter or to the
screen. From the original COLIJN & ROMIG program PCEDS, several improvements
are made concerning both the algorithms (parameterized maximum number
of elements to analyse, computation speed, analysis of the results
precision) and the accuracy of the formulae and data. Several misprints
were also corrected. Reference : "CLEDX : a stand-alone program for
quantitative X-Ray analysis of thin films using the Cliff-Lorimer
procedure", P. TREBBIA, Ultramicroscopy 27, 343-348 (1989).
---------------------------------------------------------------------------

Title                  :XMAQNT
Keywords               :quantitative correction, PAP, PROZA, XPP
Computer               :Any with ANSI-C; tested on IBM-PC, Unix (Sun and HP)
Operating System       :Any
Programming Language   :ANSI-C
Hardware Requirements  :None
Author(s)              :Cameron Davidson
Correspondence Address :CSIRO, Division of Manuf. Technol., P.O Box 883
                       :Kenmore, 4069, Australia
                       :e-mail (Internet): cjd@brb.dmt.csiro.au
Compression Method     :ZIP -use 'unzip' or 'pkunzip -d' on MS-DOS, or
                       : 'unzip -a' on Unix.
Abstract:

	XMAQNT is a software package for performing quantitative X-ray
microanalysis.  It provides:
1. A program to perform PAP, PROZ-A or XPP quantitative corrections on
	X-ray intensity ratios.
2. a library of basic atomic chemistry and X-ray related utility routines.
3. use of databases for X-ray lines, edges and Mass Absorption coefficients,
	with the possibility of supporting multiple such databases.
4. utility programs for creating, examining and editing these databases. 
5. support for plotting the calculated Phi-Rho-Z curves. (This requires
	the user to obtain the free plotting package GNUPLOT - available
	for many different operating systems.)


------------------------------------------------------------
Title                  :DCJAEMMC
Keywords               :Monte Carlo Simulations, XEDS Resolution
Computer               :IBM PC and compatibles
Operating System       :MS DOS v 2.0 or greater
Programming Language   :TurboPascal
Hardware Requirements  :Math Chip Optional but recommended
Author(s)              :David C. Joy                   
Correspondence Address :University of Tenn
                       :Em Facility, Dept. of Zoology, Knoxville, TN
				  :(615)-974-3638
		       	  :BITNET:JOY@UTKVX1

AEMMC - uses a single scattering Monte Carlo model to investigate
the spatial resolution of X ray production in  thin films. After 
computing and displaying the electron trajectories the program plots two 
pieces of data. The first is  the cumulative profile  of Xray generation 
in the solid, calibrated in angstroms and  the 0% and 90% values are 
drawn in to enable the value to be  measured easily. The second  display 
calculates the Xray signal that would be observed from a  thin unit 
width  plane-parallel  layer  such  as  a monolayer  of   some material 
sandwiched between two  grains.
------------------------------------------------------------------------

Title                  :EMMFF V. 1.0
Keywords               :XEDS,EELS,AES,WDS,CLS,GAM,XRF,PES
Computer               :IBM, MAC, DEC
Operating System       :ALL
Programming Language   :Fortran 77
Hardware Requirements  :None
Author(s)              :EMSA/MAS TASK FORCE
                        Ray Egerton ,Charles E. Fiori ,John A. Hunt,
			Mike S. Isaacson,Earl J. Kirkland ,Nestor J. Zaluzec 
Correspondence Address :R.F. EGERTON-CHAIRMAN
			University of Alberta
			Dept. of Physics
			Edmonton, Alberta, Canada, T6G2J1
Abstract:

	A simple format for the exchange of digital spectral data is 
presented, and proposed as an EMSA/MAS standard.  This format is readable by 
both humans and computers and is suitable for  transmission through various 
electronic networks (BITNET, ARPANET), the phone system (with modems) or on 
physical computer storage devices (such as floppy disks).  The format is not 
tied to any one computer, programming language or computer operating system.  
The adoption of a standard format would enable different laboratories to freely 
exchange spectral data, and would help to standarize data
analysis software. If equipment manufacturers were to support a common format, 
the microscopy and microanalysis community would avoid duplicated effort in 
writing data-analysis software. This version of EMSAMASFF contains two 
subroutines which read and write spectral data files  Version 1.0 data format. 
The data are stored as simple ASCII characters at a user defined number of 
columns per line for the  length of the data file. The spectral data is 
preceeded by a series of header lines, which tell the user about the 
parameters of the spectrum. The header lines are identified by the first 
character in the line being the symbol (#) followed by a descriptor  and if 
appropriate its units. An example of a data file format can be found in the 
EMSAMASFF.DOC file. 
------------------------------------------------------------------------------


Title                  :NEDQNT 
Keywords               :XEDS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract: 
	NEDQNT is a quantitative data analysis program which converts 
relative x-ray intensities (K and L lines only) into composition measurements
using the standardless analysis approach. The user can modify the XEDS 
detector parameters to specify Windowless, UTW or Be configurations of 
arbitrary thickness as well as perform an iterative absorption correction for
thicker samples if the specimen/detector geometry is known. The program also 
has the capability of calculating relative intensities when the user inputs
composition values, allowing the analyst to explore theoritically the
expected intensities of samples yet to be analyzed. All necessary subroutines
and data tables are included in the source code/documentation. 
NOTE: THE NEDQNT.SRC FILE CONTAINS ALL NEED DATA FILES INCLUDING TABLES
OF X-RAY LINE AND ABSORPTION EDGES THE FILE IS > 7000 LINES LONG AS A RESULT
------------------------------------------------------------------------------

Title                  :NTRANS
Keywords               :XEDS, EELS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract:

NTRANS is a computer program which translates manufacturers XEDS and EELS 
spectral data into the EMMPDL data format. It utilies the RWEMMPDL subroutines
contained in the EMMPDL. At present this version translates both EDAX and
TRACOR-Northern and Link Systems data files. Examples of translated spectra 
can be found spectra  can be found in the XEDS and EELS subdirectories of 
the EMMPDL.
-------------------------------------------------------------------------------

Title                    PCEDS 
Keywords                 AEM, EDS, X-RAY, CLIFF-LORIMER, THIN FILM,
                         XEDS
Computer                 IBM PC/XT/AT, generic MS-DOS machine
Operating System         MS-DOS
Programming Language     Microsoft Fortran v3.31
Hardware Needed          IBM PC/XT/AT or generic MS-DOS machine,
                         8087 is optional, 256kB min.
Authors                  A.D. Romig, H.O. Colijn
Correspondence Addr.     Ohio State University, Central Electron
                         Optics Facility, 042 Fontana Labs, 116    
                         W. 19th Ave. Columbus, OH  43210-1110
                         (614)292-0674

Abstract:

This program will calculate composition of thin foils using the
Cliff-Lorimer analysis of x-ray intensities.  The inte-
grated intensities of the peaks are entered manually and
the atomic and weight concentrations are calculated using
either empirical or theoretical K-factors.  This program
will not do spectral processing (i.e. background subtrac-
tion or peak deconvolution).  

Al Romig of Sandia Labs wrote the original version of this
program using DEC PDP-11 Fortran.  His work is documented in
Sandia Labs report number SAND82-2938.  Henk Colijn of OSU
translated the program to run on an IBM PC using Microsoft
Fortran v3.31 and v4.0.  Anyone needing the compiled version
should contact Henk Colijn at the above address.  The accompany-
ing PCEDS.DOC file has been formatted to be copied to a 
generic printer.  If you type the file to your CRT screen, 
you will not be able to read all the lines.
---------------------------------------------------------------------------

Title                  :RWEMMDPL
Keywords               :XEDS, EELS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract:

	RWEMMPDL contains two subroutines which read and write spectral data 
files (XEDS or EELS) in the EMMPDL Version 1.1 data format. The data are stored
as simple ASCII characters at a user defined number of columns per line for the 
length of the data file. The spectral data is preceeded by a series of header 
lines, which tell the user about the parameters of the spectrum. The header 
lines are identified by the first character in the line being the symbol (#) 
followed by a four letter descriptor  and if appropriate its units. An example
of a data file format can be found in the RWEMMPDL.DOC file. Other  examples
spectra  can be found in the XEDS and EELS subdirectories of the EMMPDL.
-------------------------------------------------------------------------------

Title                  	:XEDSDETECT
Keywords               	:XEDS
Computer               	:DEC VAX-11/730 - 11/785 or higher series
Operating System       	:VMS
Programming Language   	:Fortran IV
Hardware Requirements  	:NONE
Author(s)              	:Nestor J. Zaluzec
Correspondence Address 	:Electron Microscopy Center, Materials Science,
                       	:Argonne Nat. Lab, Argonne, IL. 60439 USA
			:Email: Zaluzec @ ANLEMC (BITNET)
Abstract: 
           
BXEDSDETECTis a general program which computes the relative detector efficiency
of Si(Li) and HP Ge EDS detector systems. The user inputs as parameters the
thickness of the respective detector absorbing layers (Parylene, Al, Be, Au,
Dead Layer and Active Layer) as well as the energy range and increment for the
calculation. Output is in simple tabular form listing energy and relative
efficiency for the chosen parameters.
------------------------------------------------------------------------------

Title                  :XENRGY
Keywords               :XEDS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract: 
	XENRGY.DAT is a data file containing all X-ray Line and Relative
Intensity ratios for elements in the range of H (Z=1) to ES (Z=99). The table 
is stored as simple ASCII characters to allow simple access and file transfer.  
Each element contains 28 entries which correspond to the following lines
KA1, KA2, KB1, KB2, KB3, LA1, LA2, LB1, LB2, LB3, LB4, LB5, LB6, LB7, LB8, LB9,
LG1, LG2, LG3, LG4, LG5, LG6, LN, LL, MA1, MA2, MB, MG, If an element doesnot 
have a particuliar X-ray line its energy is listed as zero. The program BXENRGY, 
which is given in the XENRGY.SRC file, can be used to create an efficient 
binary file from this ASCII listing, while the subroutine XENRGY can be used 
in a user written program to read the resulting binary file.
------------------------------------------------------------------------------

Title:  		LATTPARM   
KeyWords:  		Powder Diffraction, Lattice Parameters
Computer:        	PC, XT, AT
Operating System:     	MS(PC)-DOS
Programming Language:  	TURBO Pascal
Hardware:              	Math Co-Processor desirable
Author:                  Roy Garvey
Correspondence Address:  Department of Chemistry
                         North Dakota State University
                         Fargo, North Dakota
                         58105 - 5516     U S A

      Using the algorithm of Visser (1969), the problem of finding the
lattice parameters from powder diffraction data becomes one of finding the
six constants, A, B, C, D, E, and F where
Q(hkl)  =  10**4 / d**2  =  hh A + kk B + ll C + kl D + hl D + hk F       < 3 >
The unknown unit cell so derived will be triclinic.
      A perfectly general approach to the problem is to first find zones of
the lattice (net-planes of the reciprocal lattice containing the origin).
Any two such zones will have a line of intersection.  If the angle between
two such zones is found, a reciprocal lattice is determined.  Sometimes this
lattice can be reduced (described on symmetry axes in the reciprocal lattice).
---------------------------------------------------------------------------

Title:   		Least Squares Unit Cell Refinement with Indexing on the
         		Personal Computer          LSUCRIPC
KeyWords:   		Powder Diffraction, Unit Cell Refinement
Computer:               PC, XY, AT
Operating System:       MS(PC)-DOS
Programming Language:   TURBO Pascal
Hardware:   		192K memory, 1 diskette drive, math coproc.(recommended)
Author:                  Roy Garvey
Correspondence Address:  Department of Chemistry
                         North Dakota State University
                         Fargo,  ND  58105-5516
Abstract:

L S U C R I P C
                A  computer  program implementing the procedure of
           Appleman  and Evans (1973) is now available for the
           IBM-PC.   Output of refinement data has been condensed
           for economy of presentation.  For a discussion of
           methodology, see the USGS-GD-73-003 report number 20 by
           Appleman and Evans (1973).

---------------------------------------------------------------------------
Title                    BINHEX
Keywords                 ASCII, Hexadecimal, Bitnet
Computer                 IBM PC/XT/AT
Operating System         MS-DOS
Programming Language     Turbo Pascal v. 5.0
Hardware Needed          IBM PC/XT/AT
Author                   H.O. Colijn
Correspondence Addr.     Ohio State University,
                         Central Electron Optics Facility
                         042 Fontana Labs
                         116 W. 19th Ave. Columbus, OH  43210-1110
                         (614)292-0674

Abstract:

Some computer networks (such as Bitnet) can transmit ASCII files only.
Others (such as Internet) require a special facility (i.e. ftp) to
transmit binary files, whereas ASCII files can be transmitted easily
using the MAIL facilities.  While this allows source code to be trans-
mitted easily, it is difficult to send executable programs, spectral
data files, or archived files.  Many word processing programs also use
non-ASCII characters to store document formatting information.  It is
difficult for people to exchange information in the format they desire
over computer networks.

This program will convert a binary file to and from the hexadecimal
equivalents of the binary bytes.  That is, each byte in the binary
file will be converted into 2 ASCII characters (0-9,A-F) corresponding
to the value of the high and low four bits (respectively) of the
binary value.  Thus, regardless of the contents of the original file,
the resulting file is strictly ASCII.  Note that this translation
doubles the original size of the file since each byte of the binary
file is converted into 2 ASCII characters, each requiring one byte.
---------------------------------------------------------------------------

Title                  :HP45 Calculator program (enhanced) V1mod6
Keywords               :HREM, Wavelength, Scherzer, Resolution, hex, oct, bin
Computer               :anything with F77
Operating System       :anything with F77
Programming Language   :Fortran 77
Hardware Requirements  :CPU, terminal
Authors                :Tony Pitt, Owen Saxton, Graeme Wood, Mike O'Keefe, ...
Correspondence Address :MAOK@LBL.BITNET
                       :M.A. O'Keefe, NCEM, LBL 72-213, Berkeley, CA 94720
 
Abstract:   This is a program designed to emulate a scientific calculator
operating in reverse polish mode (originally based on a HP45, but now with
many enhancements, including binary, hex, and octal numbers, and electron
microscope functions like wavelength and resolution).   The HELP command
provides one-line explanations of each command.   Commands are -
 
 +        -        *        /        SQRT     REP      SIN      COS      TAN
 TYPE     DEL      PI       EXP      CLR      CUBE     SQU      REC      SWOP
 SWAP     CHS      POC      ROLL     LOG      ALOG     ASIN     ACOS     ATAN
 LN       OCT      HEX      X        DISP     INT      COMS     BIN      DEC
 INV      DEG      RAD      D>R      R>D      EXIT     WAVL     KV       SCH
 OPT      RSCH     ROPT     STO      RCL      HELP
Title                  :HP45 Calculator program (enhanced) V1mod7
Keywords               :HREM, Wavelength, Scherzer, Resolution, hex, oct, bin
Computer               :anything with F77
Operating System       :anything with F77
Programming Language   :Fortran 77
Hardware Requirements  :CPU, terminal
Authors                :Tony Pitt, Owen Saxton, Graeme Wood, Mike O'Keefe, ...
Correspondence Address :MAOK@CSA2.LBL.GOV
                       :M.A. O'Keefe, NCEM, LBL 72-213, Berkeley, CA 94720

Abstract: This is a program designed to emulate a scientific calculator
operating in reverse polish mode (originally based on a HP45, but now with
many enhancements, including binary, hex, and octal numbers, and electron
microscope functions like wavelength and resolution).   The HELP command
provides one-line explanations of each command.   Commands are -

 +        -        *        /        SQRT     REP      SIN      COS      TAN
 TYPE     DEL      PI       EXP      CLR      CUBE     SQU      REC      SWOP
 SWAP     CHS      POC      ROLL     LOG      ALOG     ASIN     ACOS     ATAN
 LN       OCT      HEX      X        DISP     INT      COMS     BIN      DEC
 INV      DEG      RAD      D>R      R>D      EXIT     WAVL     KV       SCH
 OPT      RSCH     ROPT     LIMD     LIMA     STO      RCL      HELP
 
---------------------------------------------------------------------------

Title:                  MacFAC 1.0
Keywords:               multivariate statistics, data analysis, processing,
                        filtering
Computer:               MacIntosh II family
Operating system:       system 7
Programming language:   THINK C 5.0
Hardware requirements:  math co-processor
Author(s):              Noel BONNET & Pierre TREBBIA
Correspondence:         Faculte des sciences, Universite de Reims, 
			B.P. 347,F51062 Reims cedex FRANCE.
			Fax: (33) 26 05 32 50, 
			e-mail: pierre.trebbia@univ-reims.fr

Abstract:
The purpose of MacFAC is to extract orthogonal sources of information from
data (images, spectra,...). See any basic statistic book for more
information about multivariate statistics and Factorial Analysis of
Correspondence (FAC). MacFAC is given with a test data set in order to let
you be sure that it works properly on your own computer. Read the text file
READ.ME which is embedded in the file MacFAC.sea.hqx for more information
on how the test must be done.

------------------------------------------------------------------------------