Title                  :NEDQNT 
Keywords               :XEDS
Computer               :DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System       :VAXVMS, RT-11
Programming Language   :Fortran IV
Hardware Requirements  :None
Author(s)              :Nestor J. Zaluzec
Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       :Materials Science Division, Argonne, Illinois 60439,
Abstract: 
	NEDQNT is a quantitative data analysis program which converts 
relative x-ray intensities (K and L lines only) into composition measurements
using the standardless analysis approach. The user can modify the XEDS 
detector parameters to specify Windowless, UTW or Be configurations of 
arbitrary thickness as well as perform an iterative absorption correction for
thicker samples if the specimen/detector geometry is known. The program also 
has the capability of calculating relative intensities when the user inputs
composition values, allowing the analyst to explore theoritically the
expected intensities of samples yet to be analyzed. All necessary subroutines
and data tables are included in the source code/documentation. 
NOTE: THE NEDQNT.SRC FILE CONTAINS ALL NEED DATA FILES INCLUDING TABLES
OF X-RAY LINE AND ABSORPTION EDGES THE FILE IS > 7000 LINES LONG AS A RESULT
------------------------------------------------------------------------------