Title                  :DCJAEMMC
Keywords               :Monte Carlo Simulations, XEDS Resolution
Computer               :IBM PC and compatibles
Operating System       :MS DOS v 2.0 or greater
Programming Language   :TurboPascal
Hardware Requirements  :Math Chip Optional but recommended
Author(s)              :David C. Joy                   
Correspondence Address :University of Tenn
                       :Em Facility, Dept. of Zoology, Knoxville, TN
				  :(615)-974-3638
		       	  :BITNET:JOY@UTKVX1

AEMMC - uses a single scattering Monte Carlo model to investigate
the spatial resolution of X ray production in  thin films. After 
computing and displaying the electron trajectories the program plots two 
pieces of data. The first is  the cumulative profile  of Xray generation 
in the solid, calibrated in angstroms and  the 0% and 90% values are 
drawn in to enable the value to be  measured easily. The second  display 
calculates the Xray signal that would be observed from a  thin unit 
width  plane-parallel  layer  such  as  a monolayer  of   some material 
sandwiched between two  grains.
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