Title                  :PTLIMIT
Keywords               :EELS,EDX,AEM,CTEM,STEM,DETECTION LIMITS,STATISTICS
Computer               :DEC LSI-11/73
Operating System       :RSX-11M-PLUS
Programming Language   :DEC-FORTRAN IV
Hardware Requirements  :None
Author(s)              :Dr. Pierre TREBBIA
Correspondence Address :Laboratoire de Physique des Solides
                       :Bat. 510, F91405 ORSAY CEDEX FRANCE
Abstract: When one tries to detect an element with a very small SIGNAL/NOISE 
ratio, one has to face with two main risks :

FIRST KIND RISK : state the element is present when actually it is absent.
SECOND KIND RISK : state the element is absent when actually it is present.

This program gives for two first kind risks (0.05 and 0.01) and four second 
kind risks (0.25, 0.10, 0.05 and 0.01) the resulting 8 possible values of 
minimum SIGNAL and SIGNAL/NOISE ratio.

    A complete description of the algorithm is given in "Unbiased 
Method for Signal Estimation in Electron Energy Loss Spectroscopy...", 
P. TREBBIA, Ultramicroscopy (1988).
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